Materials Reliability In Microelectronics V Volume 391

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Materials Reliability In Microelectronics V Volume 391

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Author : Anthony S. Oates
language : en
Publisher:
Release Date : 1995-10-24

Materials Reliability In Microelectronics V Volume 391 written by Anthony S. Oates and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1995-10-24 with Technology & Engineering categories.

This long-standing proceedings series is highly regarded as a premier forum for the discussion of microelectronics reliability issues. In this fifth book, emphasis is on the fundamental understanding of failure phenomena in thin-film materials. Special attention is given to electromigration and mechanical stress effects. The reliability of thin dielectrics and hot carrier degradation of transistors are also featured. Topics include: modeling and simulation of failure mechanisms; reliability issues for submicron IC technologies and packaging; stresses in thin films/lines; gate oxides; barrier layers; electromigration mechanisms; reliability issues for Cu metallizations; electromigration and microstructure; electromigration and stress voiding in circuit interconnects; and resistance measurements of electromigration damage.

Gallium Nitride And Related Materials Volume 395

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Author : R. D. Dupuis
language : en
Publisher: Materials Research Society
Release Date : 1996-09-04

Gallium Nitride And Related Materials Volume 395 written by R. D. Dupuis and has been published by Materials Research Society this book supported file pdf, txt, epub, kindle and other format this book has been release on 1996-09-04 with Technology & Engineering categories.

This book reflects the excitement in the scientific community about III-V nitrides. Based on papers presented at the First International Symposium on Gallium Nitride and Related Materials (ISGN-1), it reveals the large amount of work that has taken place since the field exploded with the announcement of commercial blue-light-emitting devices. The compound semiconductors in the III-V nitride systems are of increasing interest for high-performance optoelectronic and electronic device applications. These wide-bandgap semiconductor materials are also of great fundamental scientific interest because of their unique structural, electrical and optical properties. From the advances in the technologies for the heteroepitaxial growth of these materials, leading to improved quality and device performance, it is expected that III-V nitrides will soon be of significant practical and commercial interest. Topics include: crystal growth - substrates and early stages; molecular beam growth techniques; chemical vapor phase and alloys and novel growth techniques; structural properties; electronic properties; optical properties; point defects; hydrogen, etching and other materials processes; surfaces and metal contacts and devices.

Materials Technology And Reliability For Advanced Interconnects And Low K Dielectrics

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Author :
language : en
Publisher:
Release Date : 2004

Materials Technology And Reliability For Advanced Interconnects And Low K Dielectrics written by and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 2004 with Dielectric films categories.

Diagnostic Techniques For Semiconductor Materials Processing Volume 406

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Author : Stella W. Pang
language : en
Publisher:
Release Date : 1996-03-18

Diagnostic Techniques For Semiconductor Materials Processing Volume 406 written by Stella W. Pang and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1996-03-18 with Technology & Engineering categories.

The fabrication of Si- and compound semiconductor-based devices involves a number of steps ranging from material growth to pattern definition by lithography, and ultimately, pattern transfer by etching/deposition. The key to device manufacturing, however, is reproducibility, low cost and high yield. Diagnostic techniques allow correlation between processing and actual device performance to be established. Researchers from universities, industry and government come together in this book to examine the advances in diagnostic techniques that provide critical information on structural, optical and electrical properties of semiconductor devices, as well as monitoring techniques for equipment/processes for control and feedback. The overriding goal is for rapid, accurate materials characterization, both in situ and ex situ. Topics include: in situ diagnostics; proximal probe microscopies; optical probes of devices and device properties; spectroscopic ellipsometry/structural diagnostics; and material analysis - X-ray techniques, strain measurements and passivation.

Disordered Materials And Interfaces Volume 407

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Author : Herman Z. Cummins
language : en
Publisher:
Release Date : 1996-03-26

Disordered Materials And Interfaces Volume 407 written by Herman Z. Cummins and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1996-03-26 with Science categories.

This book focuses on the fractal aspects of materials and disordered systems. Disorder plays a critical role in many naturally occurring and manufactured materials, both at the microscopic level (e.g., glasses) and the macroscopic level (e.g., foams, dendritic alloys, porous rock). The book addresses the dynamical processes involved in the formation and characterization of a wide range of disordered materials. Topics include: porous media; colloids; chemical reactions; dynamical aspects of the liquid-glass transition; disordered materials and surfaces and scaling and nanostructures.

Materials Reliability In Microelectronics Vi Volume 428

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Author : William F. Filter
language : en
Publisher:
Release Date : 1996-11-18

Materials Reliability In Microelectronics Vi Volume 428 written by William F. Filter and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1996-11-18 with Technology & Engineering categories.

MRS books on materials reliability in microelectronics have become the snapshot of progress in this field. Reduced feature size, increased speed, and larger area are all factors contributing to the continual performance and functionality improvements in integrated circuit technology. These same factors place demands on the reliability of the individual components that make up the IC. Achieving increased reliability requires an improved understanding of both thin-film and patterned-feature materials properties and their degradation mechanisms, how materials and processes used to fabricate ICs interact, and how they may be tailored to enable reliability improvements. This book focuses on the physics and materials science of microelectronics reliability problems rather than the traditional statistical, accelerated electrical testing aspects. Studies are grouped into three large sections covering electromigration, gate oxide reliability and mechanical stress behavior. Topics include: historical summary; reliability issues for Cu metallization; characterization of electromigration phenomena; modelling; microstructural evolution and influences; oxide and device reliability; thin oxynitride dielectrics; noncontact diagnostics; stress effects in thin films and interconnects and microbeam X-ray techniques for stress measurements.

Low Dielectric Constant Materials

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Author :
language : en
Publisher:
Release Date : 1998

Low Dielectric Constant Materials written by and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1998 with Electric insulators and insulation categories.

Materials For Electrochemical Energy Storage And Conversion Batteries Capacitors And Fuel Cells

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Author : Daniel H. Doughty
language : en
Publisher:
Release Date : 1995

Materials For Electrochemical Energy Storage And Conversion Batteries Capacitors And Fuel Cells written by Daniel H. Doughty and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1995 with Science categories.

Low Dielectric Constant Materials Synthesis And Applications In Microelectronics

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Author : Toh-Ming Lu
language : en
Publisher:
Release Date : 1995

Low Dielectric Constant Materials Synthesis And Applications In Microelectronics written by Toh-Ming Lu and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1995 with Technology & Engineering categories.

Materials Theory Simulations And Parallel Algorithms Volume 408

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Author : Efthimios Kaxiras
language : en
Publisher:
Release Date : 1996-07-02

Materials Theory Simulations And Parallel Algorithms Volume 408 written by Efthimios Kaxiras and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1996-07-02 with Technology & Engineering categories.

Significant advances have been made towards understanding the properties of materials through theoretical approaches. These approaches are based either on first-principles quantum mechanical formulations or semi-empirical formulations, and have benefitted from increases in computational power. The advent of parallel computing has propelled the theoretical approaches to a new level of realism in modelling physical systems of interest. The theoretical methods and simulation techniques that are cur- rently under development are certain to become powerful tools in understanding, exploring and predicting the properties of existing and novel materials. This book discusses critically current developments in computations and simulational approaches specifically aimed at addressing real materials problems, with an emphasis on parallel computing and shows the most successful applications of computational and simulational work to date. Topics include: advances in computational methods; parallel algorithms and applications; fracture, brittle/ductile behavior and large-scale defects; thermodynamic stability of materials; surfaces and interfaces of materials; and complex materials simulations.