Flat Panel Display Materials Ii Volume 424

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Flat Panel Display Materials Ii Volume 424

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Author : Miltiadis K. Hatalis
language : en
Publisher:
Release Date : 1997-02-12

Flat Panel Display Materials Ii Volume 424 written by Miltiadis K. Hatalis and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1997-02-12 with Computers categories.

The proceedings of a symposium held April 1996, in San Francisco, California. The field is experiencing a rapid growth which currently is expanding from portable computer applications to include display applications for desktop computers and a wide array of consumer and industrial products. Seventy-six contributions are divided into six sections covering amorphous silicon thin-film transistor materials, polycrystalline silicon thin-film transistor materials, liquid crystal display materials, transparent conducting oxides, field emission display materials, and other emissive display materials. Annotation copyrighted by Book News, Inc., Portland, OR

Flat Panel Display Materials

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Author :
language : en
Publisher:
Release Date : 1996

Flat Panel Display Materials written by and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1996 with Information display devices categories.

Nanophase And Nanocomposite Materials Ii Volume 457

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Author : Sridhar Komarneni
language : en
Publisher: Cambridge University Press
Release Date : 1997-04-22

Nanophase And Nanocomposite Materials Ii Volume 457 written by Sridhar Komarneni and has been published by Cambridge University Press this book supported file pdf, txt, epub, kindle and other format this book has been release on 1997-04-22 with Science categories.

This book provides an international and interdisciplinary forum for the discussion of advances in the research of nanophase and nanocomposites. The term 'nanophase' refers to nanoscale particles of one phase, whereas the term 'nanocomposite'refers to a composite of more than one Gibbsian solid phase where at least one dimension is in the nanometer range. The book, the second in a series, features reports showing that bulk materials with nanostructure (‹ 0.5µm) often have enhanced and unique properties when compared to their coarse-structured (›1µm) equivalents. A wide range of science and engineering disciplines are represented, with topics ranging from synthesis and processing, to properties and applications. Topics include: nanophase oxides; nanophase metals, alloys and non-oxides; nanophases - simulation studies; magnetic and metal nanocomposites; oxide, non-oxide and oxide-metal nanocomposites; organic-inorganic and sol-gel nanocomposites; and nanocomposites of layered and mesoporous materials.

Defects In Electronic Materials Ii Volume 442

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Author : Jürgen Michel
language : en
Publisher:
Release Date : 1997-05-02

Defects In Electronic Materials Ii Volume 442 written by Jürgen Michel and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1997-05-02 with Technology & Engineering categories.

The pervasive role of defects in determining the thermal, mechanical, electrical, optical and magnetic properties of materials is significant as is the knowledge and operation of generation and control of defects in electronic materials. Developing novel semiconductor materials, however, requires new insights into the role of defects to achieve new properties. New experimental techniques must be developed to study defects in small structures. Research groups come together in this book from MRS to provide a vivid picture of the current problems, progress and methods in defect studies in electronic materials. Topics include new techniques in defect studies; processing induced defects, plasma-induced point defects; processing induced defects -defects and gate-oxide integrity; point defects and reaction; point defects and interactions in Si; impurity diffusion and hydrogen in Si; dislocations in group IV semiconductors; point defects and defect interactions in SiGe; point defects in III-V compounds; compensation and structural defects in III-V compounds and layers and structures.

Low Dielectric Constant Materials Ii Volume 443

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Author : André Lagendijk
language : en
Publisher:
Release Date : 1997-08-19

Low Dielectric Constant Materials Ii Volume 443 written by André Lagendijk and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1997-08-19 with Technology & Engineering categories.

Low-dielectric constant materials are needed to improve the performance and speed of future integrated circuits. In fact, the diversity of contributors to this book is testimony to the global significance of the topic to the future of semiconductor manufacturing. Presentations include those by semiconductor equipment manufacturers and chemical source suppliers, academia from six countries, four government laboratories and five major device manufacturers. Approaches to designing and implementing reduction in dielectric constant for intermetal dielectric materials are featured and range from the evolution of silicon dioxide to fluorinated silicate glass, to the use of inorganic/organic polymers and spin-on-material, to fluorinated diamond-like carbon and nanoporous silica. The book also addresses the practical aspects of the use of low-dielectric constant materials such as chemical mechanical polishing of these materials and optimization of wiring delays in devices utilizing low-k material.

Rare Earth Doped Semiconductors Ii Volume 422

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Author : S. Coffa
language : en
Publisher:
Release Date : 1996

Rare Earth Doped Semiconductors Ii Volume 422 written by S. Coffa and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1996 with Science categories.

Rare-earth doped semiconductors hold great potential for a variety of optoelectronic applications, including lasers, LEDs and optical amplifiers. In fact, the field has grown rapidly over the past several years, with a clear switch in direction. The first book by this name was devoted to rare-earth doped II-VI and III-V semiconductors; more than half of the papers in this new volume are devoted to rare-earth doped silicon. This indicates that rare-earth doping of silicon is now seriously considered as a means to achieve silicon-based optoelectronic devices. In addition, new reports on rare-earth doped III-nitrides are also presented. Researchers from 14 countries come together in the volume to discuss current trends, highlight new developments and identify potential electronic and optoelectronic applications. Topics include: incorporation methods and properties; structural, electrical and optical properties; excitation mechanisms and electroluminescence and integration.

Materials Reliability In Microelectronics Vi Volume 428

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Author : William F. Filter
language : en
Publisher:
Release Date : 1996-11-18

Materials Reliability In Microelectronics Vi Volume 428 written by William F. Filter and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1996-11-18 with Technology & Engineering categories.

MRS books on materials reliability in microelectronics have become the snapshot of progress in this field. Reduced feature size, increased speed, and larger area are all factors contributing to the continual performance and functionality improvements in integrated circuit technology. These same factors place demands on the reliability of the individual components that make up the IC. Achieving increased reliability requires an improved understanding of both thin-film and patterned-feature materials properties and their degradation mechanisms, how materials and processes used to fabricate ICs interact, and how they may be tailored to enable reliability improvements. This book focuses on the physics and materials science of microelectronics reliability problems rather than the traditional statistical, accelerated electrical testing aspects. Studies are grouped into three large sections covering electromigration, gate oxide reliability and mechanical stress behavior. Topics include: historical summary; reliability issues for Cu metallization; characterization of electromigration phenomena; modelling; microstructural evolution and influences; oxide and device reliability; thin oxynitride dielectrics; noncontact diagnostics; stress effects in thin films and interconnects and microbeam X-ray techniques for stress measurements.

Materials Issues In Art And Archaeology V Volume 462

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Author : Pamela B. Vandiver
language : en
Publisher:
Release Date : 1997-10-15

Materials Issues In Art And Archaeology V Volume 462 written by Pamela B. Vandiver and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1997-10-15 with Technology & Engineering categories.

This book presents cutting-edge multidisciplinary work on the characterization of ancient materials; the technologies of selection, production and usage by which materials are transformed into objects and artifacts; the science underlying their deterioration, preservation and conservation; and sociocultural interpretation derived from an empirical methodology of observation, measurement and experimentation. Of particular interest are contributions which explore the interface and overlap among traditional materials science, the history of technology and the archaeological and conservation sciences, or that investigate new methods and applications of materials science in art and archaeology. Topics include: analytical chemistry and spectroscopy; ancient and historical metallurgy; natural and artificial glass; characterization, sources and production of ceramics; organic materials technologies; architectural conservation and materials characterization; conservation of archaeological and historical materials; and other studies of ceramics and metals.

Materials For Mechanical And Optical Microsystems Volume 444

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Author : Michael L. Reed
language : en
Publisher:
Release Date : 1997-03-30

Materials For Mechanical And Optical Microsystems Volume 444 written by Michael L. Reed and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1997-03-30 with Mathematics categories.

A selection of 33 reviewed papers explore the materials aspects of microsystems, especially those involving mechanical, optical, and thermal components. The topics include technology for micro- assembling, selective electroless copper metallization of epoxy substrates, an improved auto-adhesion measurement method for micro-machines polysilicon beams, patterned sol-gel structures by micro-molding in capillaries, the experimental analysis of the process of anodic bonding using an evaporated glass layer, the effect of inorganic thin film material processing and properties on stress in silicon piezoresistive pressure sensors, and photoconductivity in vacuum-deposited films of silicon-based polymers. Annotation copyrighted by Book News, Inc., Portland, OR

Microstructure Evolution During Irradiation Volume 439

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Author : Ian M. Robertson
language : en
Publisher:
Release Date : 1997-06-25

Microstructure Evolution During Irradiation Volume 439 written by Ian M. Robertson and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1997-06-25 with Science categories.

This book from MRS discusses the evolution of a material's microstructure as a result of its interaction with energetic particles such as ions, neutrons or electrons. The book is inter-disciplinary and emphasizes all classes of materials including metals, intermetallic compounds, ceramics, polymers, superconductors, semiconductors and insulators. A strong focus is placed on experimental techniques for measuring and quantifying damage and microstructure changes, and on computer simulation techniques for predicting and understanding this phenomena. Topics include: ion-implantation damage in semiconductors; radiation damage in metals; radiation damage in ceramics; radiation effects in polymers and beam-induced effects.