Microstructure Evolution During Irradiation Volume 439

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Microstructure Evolution During Irradiation Volume 439

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Author : Ian M. Robertson
language : en
Publisher:
Release Date : 1997-06-25

Microstructure Evolution During Irradiation Volume 439 written by Ian M. Robertson and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1997-06-25 with Science categories.

This book from MRS discusses the evolution of a material's microstructure as a result of its interaction with energetic particles such as ions, neutrons or electrons. The book is inter-disciplinary and emphasizes all classes of materials including metals, intermetallic compounds, ceramics, polymers, superconductors, semiconductors and insulators. A strong focus is placed on experimental techniques for measuring and quantifying damage and microstructure changes, and on computer simulation techniques for predicting and understanding this phenomena. Topics include: ion-implantation damage in semiconductors; radiation damage in metals; radiation damage in ceramics; radiation effects in polymers and beam-induced effects.

Structure And Evolution Of Surfaces Volume 440

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Author : Robert C. Cammarata
language : en
Publisher:
Release Date : 1997-11-13

Structure And Evolution Of Surfaces Volume 440 written by Robert C. Cammarata and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1997-11-13 with Science categories.

This book brings together an interdisciplinary group of surface physicists, chemists and materials scientists to present the most current advances in the area of surface science. Both scientific and technological issues are addressed. Topics include: surface and step structure; morphology, roughness and instabilities; kinetic processes; nucleation on surfaces and interfaces; mechanics of surfaces; self-assembled and Langmuir-Blodgett films; thin-film surfaces and growth; chemistry and modification of surfaces and metal-semiconductor interfaces.

Gallium Nitride And Related Materials Ii Volume 468

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Author : C. R. Abernathy
language : en
Publisher: Materials Research Society
Release Date : 1997-08-13

Gallium Nitride And Related Materials Ii Volume 468 written by C. R. Abernathy and has been published by Materials Research Society this book supported file pdf, txt, epub, kindle and other format this book has been release on 1997-08-13 with Technology & Engineering categories.

This book from MRS dedicated to III-Nitrides, focuses on developments in AlN, GaN, InN and their alloys that are now finding application in short-wavelength lasers (~400nm, cw at room temperature) and high-power electronics (2.8W/mm at GHz). Experts from fields including crystal growth, condensed matter theory, source chemistry, device processing and device design come together in the volume to address issues of both scientific and technological relevance. And while much of the book reports on advances in material preparation and the understanding of defect issues, similar advances in material and device processing are also reported. Topics include: growth and doping; substrates and substrate effects; characterization; processing and device performance and design.

Materials Issues In Art And Archaeology V Volume 462

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Author : Pamela B. Vandiver
language : en
Publisher:
Release Date : 1997-10-15

Materials Issues In Art And Archaeology V Volume 462 written by Pamela B. Vandiver and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1997-10-15 with Technology & Engineering categories.

This book presents cutting-edge multidisciplinary work on the characterization of ancient materials; the technologies of selection, production and usage by which materials are transformed into objects and artifacts; the science underlying their deterioration, preservation and conservation; and sociocultural interpretation derived from an empirical methodology of observation, measurement and experimentation. Of particular interest are contributions which explore the interface and overlap among traditional materials science, the history of technology and the archaeological and conservation sciences, or that investigate new methods and applications of materials science in art and archaeology. Topics include: analytical chemistry and spectroscopy; ancient and historical metallurgy; natural and artificial glass; characterization, sources and production of ceramics; organic materials technologies; architectural conservation and materials characterization; conservation of archaeological and historical materials; and other studies of ceramics and metals.

Thin Films Structure And Morphology Volume 441

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Author : Steven C. Moss
language : en
Publisher:
Release Date : 1997-07-29

Thin Films Structure And Morphology Volume 441 written by Steven C. Moss and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1997-07-29 with Technology & Engineering categories.

An interdisciplinary group of materials scientists, physicists, chemists and engineers come together in this book to discuss recent advances in the structure and morphology of thin films. Both scientific and technological issues are addressed. Work on thin films for a host of applications including microelectronics, optics, tribology, biomedical technologies and microelectromechanical systems (MEMS) are featured. Topics include: kinetics of growth; grain growth; instabilities, segregation and ordering; silicides; metallization; stresses in thin films; deposition and growth simulations; energetic growth processes; diamond films and carbide and nitride films.

Low Dielectric Constant Materials Iii Volume 476

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Author : Carlye Case
language : en
Publisher:
Release Date : 1997

Low Dielectric Constant Materials Iii Volume 476 written by Carlye Case and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1997 with Technology & Engineering categories.

The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.

Defects In Electronic Materials Ii Volume 442

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Author : Jürgen Michel
language : en
Publisher:
Release Date : 1997-05-02

Defects In Electronic Materials Ii Volume 442 written by Jürgen Michel and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1997-05-02 with Technology & Engineering categories.

The pervasive role of defects in determining the thermal, mechanical, electrical, optical and magnetic properties of materials is significant as is the knowledge and operation of generation and control of defects in electronic materials. Developing novel semiconductor materials, however, requires new insights into the role of defects to achieve new properties. New experimental techniques must be developed to study defects in small structures. Research groups come together in this book from MRS to provide a vivid picture of the current problems, progress and methods in defect studies in electronic materials. Topics include new techniques in defect studies; processing induced defects, plasma-induced point defects; processing induced defects -defects and gate-oxide integrity; point defects and reaction; point defects and interactions in Si; impurity diffusion and hydrogen in Si; dislocations in group IV semiconductors; point defects and defect interactions in SiGe; point defects in III-V compounds; compensation and structural defects in III-V compounds and layers and structures.

Low Dielectric Constant Materials Ii Volume 443

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Author : André Lagendijk
language : en
Publisher:
Release Date : 1997-08-19

Low Dielectric Constant Materials Ii Volume 443 written by André Lagendijk and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1997-08-19 with Technology & Engineering categories.

Low-dielectric constant materials are needed to improve the performance and speed of future integrated circuits. In fact, the diversity of contributors to this book is testimony to the global significance of the topic to the future of semiconductor manufacturing. Presentations include those by semiconductor equipment manufacturers and chemical source suppliers, academia from six countries, four government laboratories and five major device manufacturers. Approaches to designing and implementing reduction in dielectric constant for intermetal dielectric materials are featured and range from the evolution of silicon dioxide to fluorinated silicate glass, to the use of inorganic/organic polymers and spin-on-material, to fluorinated diamond-like carbon and nanoporous silica. The book also addresses the practical aspects of the use of low-dielectric constant materials such as chemical mechanical polishing of these materials and optimization of wiring delays in devices utilizing low-k material.

Materials Reliability In Microelectronics Vii Volume 473

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Author : J. Joseph Clement
language : en
Publisher:
Release Date : 1997-10-20

Materials Reliability In Microelectronics Vii Volume 473 written by J. Joseph Clement and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1997-10-20 with Technology & Engineering categories.

The inexorable drive for increased integrated circuit functionality and performance places growing demands on the metal and dielectric thin films used in fabricating these circuits, as well as spurring demand for new materials applications and processes. This book directly addresses issues of widespread concern in the microelectronics industry - smaller feature sizes, new materials and new applications that challenge the reliability of new technologies. While the book continues the focus on issues related to interconnect reliability, such as electromigration and stress, particular emphasis is placed on the effects of microstructure. An underlying theme is understanding the importance of interactions among different materials and associated interfaces comprising a single structure with dimensions near or below the micrometer scale. Topics include: adhesion and fracture; gate oxide growth and oxide interfaces; surface preparation and gate oxide reliability; oxide degradation and defects; micro-structure, texture and reliability; novel measurement techniques; interconnect performance and reliability modeling; electromigration and interconnect reliability and stress and stress relaxation.

Materials For Optical Limiting Ii Volume 479

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Author : Richard Lee Sutherland
language : en
Publisher:
Release Date : 1997-12-30

Materials For Optical Limiting Ii Volume 479 written by Richard Lee Sutherland and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1997-12-30 with Technology & Engineering categories.

The proliferation of lasers and systems employing lasers has brought with it the potential for adverse effects from these bright, coherent light sources. This includes the possibility of damage from pulsed lasers, as well as temporary blinding by continuous-waver lasers. With nearly every wavelength possible being emitted by these sources, there exists a need to develop optical limiters and tunable filters which can suppress undesired radiation of any wavelength. This book addresses a number of materials and devices which have the potential for meeting the challenge. The proceedings is divided into five parts. Parts I and II cover research in organic and inorganic materials primarily based on nonlinear absorption or phase transitions for optical limiting of pulsed lasers. Part III includes photo-refractive materials and liquid crystals which find primary applications in dynamic filters. Part IV covers various aspects of device and material characterization, including nonlinear beam propagation effects. Theoretical modelling of materials properties is the subject of Part V.