X Ray Diffraction For Materials Research
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X Ray Diffraction For Materials Research
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Author : Myeongkyu Lee
language : en
Publisher: CRC Press
Release Date : 2016-02-22
X Ray Diffraction For Materials Research written by Myeongkyu Lee and has been published by CRC Press this book supported file pdf, txt, epub, kindle and other format this book has been release on 2016-02-22 with Science categories.
X-ray diffraction is a useful and powerful analysis technique for characterizing crystalline materials commonly employed in MSE, physics, and chemistry. This informative new book describes the principles of X-ray diffraction and its applications to materials characterization. It consists of three parts. The first deals with elementary crystallography and optics, which is essential for understanding the theory of X-ray diffraction discussed in the second section of the book. Part 2 describes how the X-ray diffraction can be applied for characterizing such various forms of materials as thin films, single crystals, and powders. The third section of the book covers applications of X-ray diffraction. The book presents a number of examples to help readers better comprehend the subject. X-Ray Diffraction for Materials Research: From Fundamentals to Applications also • provides background knowledge of diffraction to enable nonspecialists to become familiar with the topics • covers the practical applications as well as the underlying principle of X-ray diffraction • presents appropriate examples with answers to help readers understand the contents more easily • includes thin film characterization by X-ray diffraction with relevant experimental techniques • presents a huge number of elaborately drawn graphics to help illustrate the content The book will help readers (students and researchers in materials science, physics, and chemistry) understand crystallography and crystal structures, interference and diffraction, structural analysis of bulk materials, characterization of thin films, and nondestructive measurement of internal stress and phase transition. Diffraction is an optical phenomenon and thus can be better understood when it is explained with an optical approach, which has been neglected in other books. This book helps to fill that gap, providing information to convey the concept of X-ray diffraction and how it can be applied to the materials analysis. This book will be a valuable reference book for researchers in the field and will work well as a good introductory book of X-ray diffraction for students in materials science, physics, and chemistry.
X Ray Diffraction Crystallography
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Author : Yoshio Waseda
language : en
Publisher: Springer Science & Business Media
Release Date : 2011-03-18
X Ray Diffraction Crystallography written by Yoshio Waseda and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2011-03-18 with Technology & Engineering categories.
X-ray diffraction crystallography for powder samples is a well-established and widely used method. It is applied to materials characterization to reveal the atomic scale structure of various substances in a variety of states. The book deals with fundamental properties of X-rays, geometry analysis of crystals, X-ray scattering and diffraction in polycrystalline samples and its application to the determination of the crystal structure. The reciprocal lattice and integrated diffraction intensity from crystals and symmetry analysis of crystals are explained. To learn the method of X-ray diffraction crystallography well and to be able to cope with the given subject, a certain number of exercises is presented in the book to calculate specific values for typical examples. This is particularly important for beginners in X-ray diffraction crystallography. One aim of this book is to offer guidance to solving the problems of 90 typical substances. For further convenience, 100 supplementary exercises are also provided with solutions. Some essential points with basic equations are summarized in each chapter, together with some relevant physical constants and the atomic scattering factors of the elements.
Opto Electronics Engineering And Materials Research
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Author : J.Y Liang
language : en
Publisher: Trans Tech Publications Ltd
Release Date : 2012-09-28
Opto Electronics Engineering And Materials Research written by J.Y Liang and has been published by Trans Tech Publications Ltd this book supported file pdf, txt, epub, kindle and other format this book has been release on 2012-09-28 with Technology & Engineering categories.
Selected, peer reviewed papers from the 2012 International Meeting on Opto-Electronics Engineering and Materials Research (OEMR 2012), 27-29 July, 2012, Shenyang, Liaoning, China
X Ray And Neutron Structure Analysis In Materials Science
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Author : J. Hasek
language : en
Publisher: Springer Science & Business Media
Release Date : 2012-12-06
X Ray And Neutron Structure Analysis In Materials Science written by J. Hasek and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2012-12-06 with Science categories.
During the last few decades, crystallography has become a wide and economically important field of science with many interesting applications in materials research, in different branches of physics, chemistry, geology, pharmacology, biochemistry, electronics, in many technological processes, machinery, heavy industry, etc. Twenty Nobel prizes awarded for achieve ments belonging to this· field only underline its distinction. Crystallo graphy has become a commonly used term, but - like a whale - it is much easier to recognize than to describe because of an extreme diversity of sub jects involved which range from highly sophisticated theories to the develop ment of routine technological processes or testing of materials in produc tion. It is apparent that only some aspects of selected topics could be included on a single occasion. The conference "ADVANCED METHODS IN X-RAY AND NEUTRON STRUCTURE ANALYSIS OF MATERIALS" held in Karlovy Vary (Czechoslovakia) on October 5-9, 1987, was intended to cover the most important crystallographic aspects of ma terials science. The conference was attended by 250 people from 16 countries (Belgium,Bulgaria, China, Czechoslovakia, Finland, France, FRG, GDR, Hungary, Italy, The Netherlands, Poland, Sweden, USA, USSR and Yugoslavia).
X Ray Diffraction
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Author : C. Suryanarayana
language : en
Publisher: Springer Science & Business Media
Release Date : 1998-06-30
X Ray Diffraction written by C. Suryanarayana and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 1998-06-30 with Technology & Engineering categories.
In this, the only book available to combine both theoretical and practical aspects of x-ray diffraction, the authors emphasize a "hands on" approach through experiments and examples based on actual laboratory data. Part I presents the basics of x-ray diffraction and explains its use in obtaining structural and chemical information. In Part II, eight experimental modules enable the students to gain an appreciation for what information can be obtained by x-ray diffraction and how to interpret it. Examples from all classes of materials -- metals, ceramics, semiconductors, and polymers -- are included. Diffraction patterns and Bragg angles are provided for students without diffractometers. 192 illustrations.
Technologies In Materials Research And Application
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Author : Mihail Ionescu
language : en
Publisher: Trans Tech Publications Ltd
Release Date : 2023-12-06
Technologies In Materials Research And Application written by Mihail Ionescu and has been published by Trans Tech Publications Ltd this book supported file pdf, txt, epub, kindle and other format this book has been release on 2023-12-06 with Science categories.
Special topic volume with invited peer-reviewed papers only
Early Days Of X Ray Crystallography
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Author : André Authier
language : en
Publisher: Oxford University Press, USA
Release Date : 2013-08
Early Days Of X Ray Crystallography written by André Authier and has been published by Oxford University Press, USA this book supported file pdf, txt, epub, kindle and other format this book has been release on 2013-08 with Science categories.
2012 marked the centenary of one of the most significant discoveries of the early twentieth century, the discovery of X-ray diffraction (March 1912, by Laue, Friedrich, and Knipping) and of Bragg's law (November 1912). The discovery of X-ray diffraction confirmed the wave nature of X-rays and the space-lattice hypothesis. It had two major consequences: the analysis of the structure of atoms, and the determination of the atomic structure of materials. This had a momentous impact in chemistry, physics, mineralogy, material science, and biology. This book relates the discovery itself, the early days of X-ray crystallography, and the way the news of the discovery spread round the world. It explains how the first crystal structures were determined, and recounts which were the early applications of X-ray crystallography. It also tells how the concept of space lattice has developed since ancient times, and how our understanding of the nature of light has changed over time. The contributions of the main actors of the story, prior to the discovery, at the time of the discovery and immediately afterwards, are described through their writings and are put into the context of the time, accompanied by brief biographical details.
X Ray Characterization Of Materials
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Author : Eric Lifshin
language : en
Publisher: John Wiley & Sons
Release Date : 2008-07-11
X Ray Characterization Of Materials written by Eric Lifshin and has been published by John Wiley & Sons this book supported file pdf, txt, epub, kindle and other format this book has been release on 2008-07-11 with Technology & Engineering categories.
Linking of materials properties with microstructures is a fundamental theme in materials science, for which a detailed knowledge of the modern characterization techniques is essential. Since modern materials such as high-temperature alloys, engineering thermoplastics and multilayer semiconductor films have many elemental constituents distributed in more than one phase, characterization is essential to the systematic development of such new materials and understanding how they behave in practical applications. X-ray techniques play a major role in providing information on the elemental composition and crystal and grain structures of all types of materials. The challenge to the materials characterization expert is to understand how specific instruments and analytical techniques can provide detailed information about what makes each material unique. The challenge to the materials scientist, chemist, or engineer is to know what information is needed to fully characterize each material and how to use this information to explain its behavior, develop new and improved properties, reduce costs, or ensure compliance with regulatory requirements. This comprehensive handbook presents all the necessary background to understand the applications of X-ray analysis to materials characterization with particular attention to the modern approach to these methods.
Diffraction Analysis Of The Microstructure Of Materials
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Author : Eric J. Mittemeijer
language : en
Publisher: Springer Science & Business Media
Release Date : 2013-11-21
Diffraction Analysis Of The Microstructure Of Materials written by Eric J. Mittemeijer and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2013-11-21 with Science categories.
Diffraction Analysis of the Microstructure of Materials provides an overview of diffraction methods applied to the analysis of the microstructure of materials. Since crystallite size and the presence of lattice defects have a decisive influence on the properties of many engineering materials, information about this microstructure is of vital importance in developing and assessing materials for practical applications. The most powerful and usually non-destructive evaluation techniques available are X-ray and neutron diffraction. The book details, among other things, diffraction-line broadening methods for determining crystallite size and atomic-scale strain due, e.g. to dislocations, and methods for the analysis of residual (macroscale) stress. The book assumes only a basic knowledge of solid-state physics and supplies readers sufficient information to apply the methods themselves.
Materials Science And Engineering Application Ii
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Author : Shuan Fa Chen
language : en
Publisher: Trans Tech Publications Ltd
Release Date : 2011-12-06
Materials Science And Engineering Application Ii written by Shuan Fa Chen and has been published by Trans Tech Publications Ltd this book supported file pdf, txt, epub, kindle and other format this book has been release on 2011-12-06 with Technology & Engineering categories.
Selected, peer reviewed papers from the 2nd International Conference on Materials Science and Engineering Application (ICMSEA 2012), January 7-8, 2012, Xi’an, China