Vlsi Electronics Vlsi Reliability

DOWNLOAD

Download Vlsi Electronics Vlsi Reliability PDF/ePub or read online books in Mobi eBooks. Click Download or Read Online button to get Vlsi Electronics Vlsi Reliability book now. This website allows unlimited access to, at the time of writing, more than 1.5 million titles, including hundreds of thousands of titles in various foreign languages. If the content not found or just blank you must refresh this page

Vlsi Electronics Vlsi Reliability

DOWNLOAD
Author : Norman G. Einspruch
language : en
Publisher:
Release Date : 1981

Vlsi Electronics Vlsi Reliability written by Norman G. Einspruch and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1981 with Integrated circuits categories.

Electronics Division Colloquium On Sub Micron Vlsi Reliability

DOWNLOAD
Author :
language : en
Publisher:
Release Date : 1992

Electronics Division Colloquium On Sub Micron Vlsi Reliability written by and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1992 with categories.

Energy Efficient And Reliable Embedded Nanoscale Sram Design

DOWNLOAD
Author : Bhupendra Singh Reniwal
language : en
Publisher: CRC Press
Release Date : 2023-11-29

Energy Efficient And Reliable Embedded Nanoscale Sram Design written by Bhupendra Singh Reniwal and has been published by CRC Press this book supported file pdf, txt, epub, kindle and other format this book has been release on 2023-11-29 with Technology & Engineering categories.

This reference text covers a wide spectrum for designing robust embedded memory and peripheral circuitry. It will serve as a useful text for senior undergraduate and graduate students and professionals in areas including electronics and communications engineering, electrical engineering, mechanical engineering, and aerospace engineering. Discusses low-power design methodologies for static random-access memory (SRAM) Covers radiation-hardened SRAM design for aerospace applications Focuses on various reliability issues that are faced by submicron technologies Exhibits more stable memory topologies Nanoscale technologies unveiled significant challenges to the design of energy- efficient and reliable SRAMs. This reference text investigates the impact of process variation, leakage, aging, soft errors and related reliability issues in embedded memory and periphery circuitry. The text adopts a unique way to explain the SRAM bitcell, array design, and analysis of its design parameters to meet the sub-nano-regime challenges for complementary metal-oxide semiconductor devices. It comprehensively covers low- power-design methodologies for SRAM, exhibits more stable memory topologies, and radiation-hardened SRAM design for aerospace applications. Every chapter includes a glossary, highlights, a question bank, and problems. The text will serve as a useful text for senior undergraduate students, graduate students, and professionals in areas including electronics and communications engineering, electrical engineering, mechanical engineering, and aerospace engineering. Discussing comprehensive studies of variability-induced failure mechanism in sense amplifiers and power, delay, and read yield trade-offs, this reference text will serve as a useful text for senior undergraduate, graduate students, and professionals in areas including electronics and communications engineering, electrical engineering, mechanical engineering, and aerospace engineering. It covers the development of robust SRAMs, well suited for low-power multi-core processors for wireless sensors node, battery-operated portable devices, personal health care assistants, and smart Internet of Things applications.

Naval Research Reviews

DOWNLOAD
Author :
language : en
Publisher:
Release Date : 1988

Naval Research Reviews written by and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1988 with Naval research categories.

The Reliability Handbook

DOWNLOAD
Author : National Semiconductor Corporation
language : en
Publisher:
Release Date : 1987

The Reliability Handbook written by National Semiconductor Corporation and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1987 with Electronic apparatus and appliances categories.

Long Term Reliability Of Nanometer Vlsi Systems

DOWNLOAD
Author : Sheldon Tan
language : en
Publisher: Springer Nature
Release Date : 2019-09-12

Long Term Reliability Of Nanometer Vlsi Systems written by Sheldon Tan and has been published by Springer Nature this book supported file pdf, txt, epub, kindle and other format this book has been release on 2019-09-12 with Technology & Engineering categories.

This book provides readers with a detailed reference regarding two of the most important long-term reliability and aging effects on nanometer integrated systems, electromigrations (EM) for interconnect and biased temperature instability (BTI) for CMOS devices. The authors discuss in detail recent developments in the modeling, analysis and optimization of the reliability effects from EM and BTI induced failures at the circuit, architecture and system levels of abstraction. Readers will benefit from a focus on topics such as recently developed, physics-based EM modeling, EM modeling for multi-segment wires, new EM-aware power grid analysis, and system level EM-induced reliability optimization and management techniques. Reviews classic Electromigration (EM) models, as well as existing EM failure models and discusses the limitations of those models; Introduces a dynamic EM model to address transient stress evolution, in which wires are stressed under time-varying current flows, and the EM recovery effects. Also includes new, parameterized equivalent DC current based EM models to address the recovery and transient effects; Presents a cross-layer approach to transistor aging modeling, analysis and mitigation, spanning multiple abstraction levels; Equips readers for EM-induced dynamic reliability management and energy or lifetime optimization techniques, for many-core dark silicon microprocessors, embedded systems, lower power many-core processors and datacenters.

Microelectronics Manufacturing Diagnostics Handbook

DOWNLOAD
Author : Abraham Landzberg
language : en
Publisher: Springer Science & Business Media
Release Date : 2012-12-06

Microelectronics Manufacturing Diagnostics Handbook written by Abraham Landzberg and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2012-12-06 with Technology & Engineering categories.

The world of microelectronics is filled with cusses measurement systems, manufacturing many success stories. From the use of semi control techniques, test, diagnostics, and fail ure analysis. It discusses methods for modeling conductors for powerful desktop computers to their use in maintaining optimum engine per and reducing defects, and for preventing de formance in modem automobiles, they have fects in the first place. The approach described, clearly improved our daily lives. The broad while geared to the microelectronics world, has useability of the technology is enabled, how applicability to any manufacturing process of similar complexity. The authors comprise some ever, only by the progress made in reducing their cost and improving their reliability. De of the best scientific minds in the world, and fect reduction receives a significant focus in our are practitioners of the art. The information modem manufacturing world, and high-quality captured here is world class. I know you will diagnostics is the key step in that process. find the material to be an excellent reference in of product failures enables step func Analysis your application. tion improvements in yield and reliability. which works to reduce cost and open up new Dr. Paul R. Low applications and technologies. IBM Vice President and This book describes the process ofdefect re of Technology Products General Manager duction in the microelectronics world.

Soft Error Reliability Of Vlsi Circuits

DOWNLOAD
Author : Behnam Ghavami
language : en
Publisher: Springer Nature
Release Date : 2020-10-13

Soft Error Reliability Of Vlsi Circuits written by Behnam Ghavami and has been published by Springer Nature this book supported file pdf, txt, epub, kindle and other format this book has been release on 2020-10-13 with Technology & Engineering categories.

This book is intended for readers who are interested in the design of robust and reliable electronic digital systems. The authors cover emerging trends in design of today’s reliable electronic systems which are applicable to safety-critical applications, such as automotive or healthcare electronic systems. The emphasis is on modeling approaches and algorithms for analysis and mitigation of soft errors in nano-scale CMOS digital circuits, using techniques that are the cornerstone of Computer Aided Design (CAD) of reliable VLSI circuits. The authors introduce software tools for analysis and mitigation of soft errors in electronic systems, which can be integrated easily with design flows. In addition to discussing soft error aware analysis techniques for combinational logic, the authors also describe new soft error mitigation strategies targeting commercial digital circuits. Coverage includes novel Soft Error Rate (SER) analysis techniques such as process variation aware SER estimation and GPU accelerated SER analysis techniques, in addition to SER reduction methods such as gate sizing and logic restructuring based SER techniques.

Frontiers In Electronics Materials And Processing 1985

DOWNLOAD
Author : L. J. Brillson
language : en
Publisher: American Institute of Physics
Release Date : 1986

Frontiers In Electronics Materials And Processing 1985 written by L. J. Brillson and has been published by American Institute of Physics this book supported file pdf, txt, epub, kindle and other format this book has been release on 1986 with Science categories.

Proceedings Of The Fourth International Pacific Conference On Automotive Engineering Wednesday And Thursday

DOWNLOAD
Author :
language : en
Publisher:
Release Date : 1987

Proceedings Of The Fourth International Pacific Conference On Automotive Engineering Wednesday And Thursday written by and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1987 with Motor vehicles categories.