Semiconductor Material And Device Characterization

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Semiconductor Material And Device Characterization

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Author : Dieter K. Schroder
language : en
Publisher: Wiley-Interscience
Release Date : 1990-07-04

Semiconductor Material And Device Characterization written by Dieter K. Schroder and has been published by Wiley-Interscience this book supported file pdf, txt, epub, kindle and other format this book has been release on 1990-07-04 with Technology & Engineering categories.

The first book devoted to modern techniques of semiconductor characterization, this comprehensive guide to semiconductor measurement methods is detailed enough for a two-term graduate course. Organized for quick access so that it can be used as a handbook of specific characterization techniques. Processes are characterized through the use of test structures and the main techniques used within the semiconductor industry are thoroughly explained. While the majority of the book is devoted to widely used electrical characterization methods, the more specialized optical, chemical and physical methods are also covered. Contains over 1,300 references.

Semiconductor Material And Device Characterization

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Author : Dieter K. Schroder
language : en
Publisher: John Wiley & Sons
Release Date : 2006-02-10

Semiconductor Material And Device Characterization written by Dieter K. Schroder and has been published by John Wiley & Sons this book supported file pdf, txt, epub, kindle and other format this book has been release on 2006-02-10 with Technology & Engineering categories.

This Third Edition updates a landmark text with the latest findings The Third Edition of the internationally lauded Semiconductor Material and Device Characterization brings the text fully up-to-date with the latest developments in the field and includes new pedagogical tools to assist readers. Not only does the Third Edition set forth all the latest measurement techniques, but it also examines new interpretations and new applications of existing techniques. Semiconductor Material and Device Characterization remains the sole text dedicated to characterization techniques for measuring semiconductor materials and devices. Coverage includes the full range of electrical and optical characterization methods, including the more specialized chemical and physical techniques. Readers familiar with the previous two editions will discover a thoroughly revised and updated Third Edition, including: Updated and revised figures and examples reflecting the most current data and information 260 new references offering access to the latest research and discussions in specialized topics New problems and review questions at the end of each chapter to test readers' understanding of the material In addition, readers will find fully updated and revised sections in each chapter. Plus, two new chapters have been added: Charge-Based and Probe Characterization introduces charge-based measurement and Kelvin probes. This chapter also examines probe-based measurements, including scanning capacitance, scanning Kelvin force, scanning spreading resistance, and ballistic electron emission microscopy. Reliability and Failure Analysis examines failure times and distribution functions, and discusses electromigration, hot carriers, gate oxide integrity, negative bias temperature instability, stress-induced leakage current, and electrostatic discharge. Written by an internationally recognized authority in the field, Semiconductor Material and Device Characterization remains essential reading for graduate students as well as for professionals working in the field of semiconductor devices and materials. An Instructor's Manual presenting detailed solutions to all the problems in the book is available from the Wiley editorial department.

Semiconductor Material And Device Characterization

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Author : Schroder
language : en
Publisher: Wiley-Interscience
Release Date : 1998-12-01

Semiconductor Material And Device Characterization written by Schroder and has been published by Wiley-Interscience this book supported file pdf, txt, epub, kindle and other format this book has been release on 1998-12-01 with categories.

Analytical And Diagnostic Techniques For Semiconductor Materials Devices And Processes 7

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Author : Dieter K. Schroder
language : en
Publisher: The Electrochemical Society
Release Date : 2007

Analytical And Diagnostic Techniques For Semiconductor Materials Devices And Processes 7 written by Dieter K. Schroder and has been published by The Electrochemical Society this book supported file pdf, txt, epub, kindle and other format this book has been release on 2007 with Technology & Engineering categories.

Diagnostic characterization techniques for semiconductor materials, devices and device processing are addressed at this symposium. It will cover new techniques as well as advances in routine analytical technology applied to semiconductor process development and manufacture. The hardcover edition includes a CD-ROM of ECS Transactions, Volume 10, Issue 1, Analytical Techniques for Semiconductor Materials and Process Characterization 5 (ALTECH 2007). The PDF edition also includes the ALTECH 2007 papers.

Analytical And Diagnostic Techniques For Semiconductor Materials Devices And Processes

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Author : Bernd O. Kolbesen (Chemiker.)
language : en
Publisher: The Electrochemical Society
Release Date : 1999

Analytical And Diagnostic Techniques For Semiconductor Materials Devices And Processes written by Bernd O. Kolbesen (Chemiker.) and has been published by The Electrochemical Society this book supported file pdf, txt, epub, kindle and other format this book has been release on 1999 with Technology & Engineering categories.

Analytical And Diagnostic Techniques For Semiconductor Materials Devices And Processes

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Author : Bernd O. Kolbesen
language : en
Publisher: The Electrochemical Society
Release Date : 2003

Analytical And Diagnostic Techniques For Semiconductor Materials Devices And Processes written by Bernd O. Kolbesen and has been published by The Electrochemical Society this book supported file pdf, txt, epub, kindle and other format this book has been release on 2003 with Technology & Engineering categories.

.".. ALTECH 2003 was Symposium J1 held at the 203rd Meeting of the Electrochemical Society in Paris, France from April 27 to May 2, 2003 ... Symposium M1, Diagnostic Techniques for Semiconductor Materials and Devices, was part of the 202nd Meeting of the Electrochemical Society held in Salt Lake City, Utah, from October 21 to 25, 2002 ..."--p. iii.

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Author : 国立国会図書館 (Japan)
language : en
Publisher:
Release Date : 1900

written by 国立国会図書館 (Japan) and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1900 with Science categories.

Ieee Circuits Devices

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Author :
language : en
Publisher:
Release Date : 2000

Ieee Circuits Devices written by and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 2000 with Electrical engineering categories.

Organic Semiconductor Material And Device Characterization By Low Frequency Noise And Admittance Spectroscopy Of Polymer

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Author : Giovanni Landi
language : en
Publisher:
Release Date : 2014

Organic Semiconductor Material And Device Characterization By Low Frequency Noise And Admittance Spectroscopy Of Polymer written by Giovanni Landi and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 2014 with categories.

Optical Characterization Techniques For Semiconductor Technology

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Author : D. E. Aspnes
language : en
Publisher:
Release Date : 1981

Optical Characterization Techniques For Semiconductor Technology written by D. E. Aspnes and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1981 with Technology & Engineering categories.