Fault And Defect Tolerant Computer Architectures
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Fault And Defect Tolerant Computer Architectures
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Author : GEORGE R. ROELKE
language : en
Publisher: Hutson Street Press
Release Date : 2025-05-22
Fault And Defect Tolerant Computer Architectures written by GEORGE R. ROELKE and has been published by Hutson Street Press this book supported file pdf, txt, epub, kindle and other format this book has been release on 2025-05-22 with Computers categories.
As conventional silicon Complementary Metal-Oxide-Semiconductor (CMOS) technology continues to shrink, logic circuits are increasingly subject to errors in- duced by electrical noise and cosmic radiation. In addition, the smaller devices are more likely to degrade and fail in operation. In the long term, new device technolo- gies such as quantum cellular automata and molecular crossbars may replace silicon CMOS, but they have significant reliability problems. Rather than requiring the cir- cuit to be defect-free, fault tolerance techniques incorporated into an architecture allow continued system operation in the presence of faulty components. This research addresses construction of a reliable computer from unreliable de- vice technologies. A system architecture is developed for a "fault and defect tolerant" (FDT) computer. Trade-offs between different techniques are studied, and the yield of the system is modelled. Yield and hardware cost models are developed for the fault tolerance techniques used in the architecture. Fault and defect tolerant designs are created for the processor, and its most critical component, the cache memory. This work has been selected by scholars as being culturally important, and is part of the knowledge base of civilization as we know it. This work was reproduced from the original artifact, and remains as true to the original work as possible. Therefore, you will see the original copyright references, library stamps (as most of these works have been housed in our most important libraries around the world), and other notations in the work. This work is in the public domain in the United States of America, and possibly other nations. Within the United States, you may freely copy and distribute this work, as no entity (individual or corporate) has a copyright on the body of the work. As a reproduction of a historical artifact, this work may contain missing or blurred pages, poor pictures, errant marks, etc. Scholars believe, and we concur, that this work is important enough to be preserved, reproduced, and made generally available to the public. We appreciate your support of the preservation process, and thank you for being an important part of keeping this knowledge alive and relevant.
Fault And Defect Tolerant Computer Architectures
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Author : George R. Roelke (IV.)
language : en
Publisher:
Release Date : 2006
Fault And Defect Tolerant Computer Architectures written by George R. Roelke (IV.) and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 2006 with Computer architecture categories.
Fault And Defect Tolerant Computer Architectures
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Author : George R. Roelke (IV.)
language : en
Publisher:
Release Date : 2006
Fault And Defect Tolerant Computer Architectures written by George R. Roelke (IV.) and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 2006 with Computer architecture categories.
Defect And Fault Tolerance In Vlsi Systems
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Author : Robert Aitken
language : en
Publisher:
Release Date : 2004
Defect And Fault Tolerance In Vlsi Systems written by Robert Aitken and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 2004 with Technology & Engineering categories.
DFT 2004 showcases the latest research results in the in the field of defect and fault tolerance in VLSI systems. Its papers cover yield, defect and fault tolerance, error correction, and circuit/system reliability and dependability.
Defect And Fault Tolerance In Vlsi Systems
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Author : C.H. Stapper
language : en
Publisher: Springer
Release Date : 1990-10-31
Defect And Fault Tolerance In Vlsi Systems written by C.H. Stapper and has been published by Springer this book supported file pdf, txt, epub, kindle and other format this book has been release on 1990-10-31 with Technology & Engineering categories.
Higher circuit densities, increasingly more complex application ohjectives, and advanced packaging technologies have suhstantially increased the need to incorporate defect-tolerance and fault-tolerance in the design of VLSI and WSI systems. The goals of defect-tolerance and fault-tolerance are yield enhancement and improved reliahility. The emphasis on this area has resulted in a new field of interdisciplinary scientific research. I n fact, advanced methods of defect/fault control and tolerance are resulting in enhanced manufacturahility and productivity of integrated circuit chips, VI.SI systems, and wafer scale integrated circuits. In 1987, Dr. W. Moore organized an "International Workshop on Designing for Yield" at Oxford University. Edited papers of that workshop were published in reference [II. The participants in that workshop agreed that meetings of this type should he con tinued. preferahly on a yearly hasis. It was Dr. I. Koren who organized the "IEEE Inter national Workshop on Defect and Fault Tolerance in VLSI Systems" in Springfield Massachusetts the next year. Selected papers from that workshop were puhlished as the first volume of this series [21.
Defect And Fault Tolerance In Vlsi Systems
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Author : Israel Koren
language : en
Publisher: Springer Science & Business Media
Release Date : 2012-12-06
Defect And Fault Tolerance In Vlsi Systems written by Israel Koren and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2012-12-06 with Computers categories.
This book contains an edited selection of papers presented at the International Workshop on Defect and Fault Tolerance in VLSI Systems held October 6-7, 1988 in Springfield, Massachusetts. Our thanks go to all the contributors and especially the members of the program committee for the difficult and time-consuming work involved in selecting the papers that were presented in the workshop and reviewing the papers included in this book. Thanks are also due to the IEEE Computer Society (in particular, the Technical Committee on Fault-Tolerant Computing and the Technical Committee on VLSI) and the University of Massachusetts at Amherst for sponsoring the workshop, and to the National Science Foundation for supporting (under grant number MIP-8803418) the keynote address and the distribution of this book to all workshop attendees. The objective of the workshop was to bring t. ogether researchers and practition ers from both industry and academia in the field of defect tolerance and yield en ha. ncement in VLSI to discuss their mutual interests in defect-tolerant architectures and models for integrated circuit defects, faults, and yield. Progress in this area was slowed down by the proprietary nature of yield-related data, and by the lack of appropriate forums for disseminating such information. The goal of this workshop was therefore to provide a forum for a dialogue and exchange of views. A follow-up workshop in October 1989, with C. H. Stapper from IBM and V. K. Jain from the University of South Florida as general co-chairmen, is being organized.
Defect And Fault Tolerance In Vlsi Systems
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Author : Israel Koren
language : en
Publisher: Springer
Release Date : 1989-08-01
Defect And Fault Tolerance In Vlsi Systems written by Israel Koren and has been published by Springer this book supported file pdf, txt, epub, kindle and other format this book has been release on 1989-08-01 with Computers categories.
This book contains an edited selection of papers presented at the International Workshop on Defect and Fault Tolerance in VLSI Systems held October 6-7, 1988 in Springfield, Massachusetts. Our thanks go to all the contributors and especially the members of the program committee for the difficult and time-consuming work involved in selecting the papers that were presented in the workshop and reviewing the papers included in this book. Thanks are also due to the IEEE Computer Society (in particular, the Technical Committee on Fault-Tolerant Computing and the Technical Committee on VLSI) and the University of Massachusetts at Amherst for sponsoring the workshop, and to the National Science Foundation for supporting (under grant number MIP-8803418) the keynote address and the distribution of this book to all workshop attendees. The objective of the workshop was to bring t. ogether researchers and practition ers from both industry and academia in the field of defect tolerance and yield en ha. ncement in VLSI to discuss their mutual interests in defect-tolerant architectures and models for integrated circuit defects, faults, and yield. Progress in this area was slowed down by the proprietary nature of yield-related data, and by the lack of appropriate forums for disseminating such information. The goal of this workshop was therefore to provide a forum for a dialogue and exchange of views. A follow-up workshop in October 1989, with C. H. Stapper from IBM and V. K. Jain from the University of South Florida as general co-chairmen, is being organized.
Yield Modelling And Defect Tolerance In Vlsi Papers Presented At The Int Workshop On Designing For Yield 1 3 July 1987 Oxford
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Author : Will R. Moore
language : en
Publisher: CRC Press
Release Date : 1988
Yield Modelling And Defect Tolerance In Vlsi Papers Presented At The Int Workshop On Designing For Yield 1 3 July 1987 Oxford written by Will R. Moore and has been published by CRC Press this book supported file pdf, txt, epub, kindle and other format this book has been release on 1988 with Art categories.
Papers of the International Workshop on Designing for Yield, Oxford, July 1987. Objectives include discussion of topics in VLSI and designing integrated circuits to yield targets. On yield loss mechanisms and defect tolerance, alternative prospects, catastrophic yield loss models, parametric yield l
Fault Tolerant Computing Symposium
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Author :
language : en
Publisher:
Release Date : 1987
Fault Tolerant Computing Symposium written by and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1987 with Fault-tolerant computing categories.
Defect And Fault Tolerance In Vlsi Systems
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Author : Israel Koren
language : en
Publisher: Springer
Release Date : 1989-08-01
Defect And Fault Tolerance In Vlsi Systems written by Israel Koren and has been published by Springer this book supported file pdf, txt, epub, kindle and other format this book has been release on 1989-08-01 with Computers categories.
This book contains an edited selection of papers presented at the International Workshop on Defect and Fault Tolerance in VLSI Systems held October 6-7, 1988 in Springfield, Massachusetts. Our thanks go to all the contributors and especially the members of the program committee for the difficult and time-consuming work involved in selecting the papers that were presented in the workshop and reviewing the papers included in this book. Thanks are also due to the IEEE Computer Society (in particular, the Technical Committee on Fault-Tolerant Computing and the Technical Committee on VLSI) and the University of Massachusetts at Amherst for sponsoring the workshop, and to the National Science Foundation for supporting (under grant number MIP-8803418) the keynote address and the distribution of this book to all workshop attendees. The objective of the workshop was to bring t. ogether researchers and practition ers from both industry and academia in the field of defect tolerance and yield en ha. ncement in VLSI to discuss their mutual interests in defect-tolerant architectures and models for integrated circuit defects, faults, and yield. Progress in this area was slowed down by the proprietary nature of yield-related data, and by the lack of appropriate forums for disseminating such information. The goal of this workshop was therefore to provide a forum for a dialogue and exchange of views. A follow-up workshop in October 1989, with C. H. Stapper from IBM and V. K. Jain from the University of South Florida as general co-chairmen, is being organized.