Cmos Test And Evaluation

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Cmos Test And Evaluation

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Author : Manjul Bhushan
language : en
Publisher: Springer
Release Date : 2014-12-03

Cmos Test And Evaluation written by Manjul Bhushan and has been published by Springer this book supported file pdf, txt, epub, kindle and other format this book has been release on 2014-12-03 with Technology & Engineering categories.

CMOS Test and Evaluation: A Physical Perspective is a single source for an integrated view of test and data analysis methodology for CMOS products, covering circuit sensitivities to MOSFET characteristics, impact of silicon technology process variability, applications of embedded test structures and sensors, product yield, and reliability over the lifetime of the product. This book also covers statistical data analysis and visualization techniques, test equipment and CMOS product specifications, and examines product behavior over its full voltage, temperature and frequency range.

Ieee Vlsi Test Symposium

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Author :
language : en
Publisher:
Release Date : 1995

Ieee Vlsi Test Symposium written by and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1995 with Application-specific integrated circuits categories.

Evaluation Of A Cmos Sos Process Using Process Validation Wafers

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Author : John S. Suehle
language : en
Publisher:
Release Date : 1982

Evaluation Of A Cmos Sos Process Using Process Validation Wafers written by John S. Suehle and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1982 with Integrated circuits categories.

The objective of this work was to determine baseline electrical parameters that could be used to evaluate a fabrication process. Two lots of wafers containing NBS-16 test chips were fabricated at a commercial vendor in a radiation-hard, CMOS/SOS process. These wafers were then returned to NBS for testing and evaluation. Testing was performed using an automated computer-controlled integrated circuit test system. Test results were evaluated using analysis techniques which provided a statistical estimate of selected parameters and identified spatial correlations between data sets. Further analysis was then performed in order to identify process irregularities. A complete description of the test results and analysis procedure can be found in the appendices.

19th Ieee Vlsi Test Symposium

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Author :
language : en
Publisher: Institute of Electrical & Electronics Engineers(IEEE)
Release Date : 2001

19th Ieee Vlsi Test Symposium written by and has been published by Institute of Electrical & Electronics Engineers(IEEE) this book supported file pdf, txt, epub, kindle and other format this book has been release on 2001 with Computers categories.

Collects 58 papers from the April/May 2001 symposium that explore new approaches in the testing of electronic circuits and systems. Key areas in testing are discussed, such as BIST, analog measurement, fault tolerance, diagnosis methods, scan chain design, memory test and diagnosis, and test data compression and compaction. Also on the program are sessions on emerging areas that are gaining prominence, including low power testing, testing high speed circuits on low cost testers, processor based self test techniques, and core- based system-on-chip testing. Some of the topics are robust and low cost BIST architectures for sequential fault testing in datapath multipliers, a method for measuring the cycle-to-cycle period jitter of high-frequency clock signals, fault equivalence identification using redundancy information and static and dynamic extraction, and test scheduling for minimal energy consumption under power constraints. No subject index. c. Book News Inc.

Emerging Trends In Technological Innovation

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Author : Luis M. Camarinha-Matos
language : en
Publisher: Springer Science & Business Media
Release Date : 2010-02-09

Emerging Trends In Technological Innovation written by Luis M. Camarinha-Matos and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2010-02-09 with Computers categories.

Identifying Emerging Trends in Technological Innovation Doctoral programs in science and engineering are important sources of innovative ideas and techniques that might lead to new products and technological innovation. Certainly most PhD students are not experienced researchers and are in the process of learning how to do research. Nevertheless, a number of empiric studies also show that a high number of technological innovation ideas are produced in the early careers of researchers. The combination of the eagerness to try new approaches and directions of young doctoral students with the experience and broad knowledge of their supervisors is likely to result in an important pool of innovation potential. The DoCEIS doctoral conference on Computing, Electrical and Industrial En- neering aims at creating a space for sharing and discussing ideas and results from doctoral research in these inter-related areas of engineering. Innovative ideas and hypotheses can be better enhanced when presented and discussed in an encouraging and open environment. DoCEIS aims to provide such an environment, releasing PhD students from the pressure of presenting their propositions in more formal contexts.

Scientific And Technical Aerospace Reports

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Author :
language : en
Publisher:
Release Date : 1991

Scientific And Technical Aerospace Reports written by and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1991 with Aeronautics categories.

Proceedings International Test Conference 1997

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Author :
language : en
Publisher:
Release Date : 1997

Proceedings International Test Conference 1997 written by and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1997 with Automatic test equipment categories.

Analyzing The Hazard Evaluation Process

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Author : Kenneth L. Dickson
language : en
Publisher: American Fisheries Society
Release Date : 1979

Analyzing The Hazard Evaluation Process written by Kenneth L. Dickson and has been published by American Fisheries Society this book supported file pdf, txt, epub, kindle and other format this book has been release on 1979 with Technology & Engineering categories.

Proceedings

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Author :
language : en
Publisher:
Release Date : 1989

Proceedings written by and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1989 with Computer storage devices categories.

Laser Focus World

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Author :
language : en
Publisher:
Release Date : 2007

Laser Focus World written by and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 2007 with Electrooptics categories.

"Global electro-optic technology and markets." "Photonics technologies & solutions for technical professionals worldwide."