Advances In X Ray Analysis
DOWNLOAD
Download Advances In X Ray Analysis PDF/ePub or read online books in Mobi eBooks. Click Download or Read Online button to get Advances In X Ray Analysis book now. This website allows unlimited access to, at the time of writing, more than 1.5 million titles, including hundreds of thousands of titles in various foreign languages. If the content not found or just blank you must refresh this page
Advances In X Ray Analysis
DOWNLOAD
Author : Gavin R. Mallett
language : en
Publisher: Springer Science & Business Media
Release Date : 2013-11-21
Advances In X Ray Analysis written by Gavin R. Mallett and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2013-11-21 with Science categories.
The papers presented in this volume of Advances in X-Ray Analysis were chosen from those presented at the Fourteenth Annual Conference on the Applications of X-Ray Analysis. This conference, sponsored by the Metallurgy Division of the Denver Research Institute, University of Denver, was held on August 24,25, and 26, 1965, at the Albany Hotel in Denver, Colorado. Of the 56 papers presented at the conference, 46 are included in this volume; also included is an open discussion held on the effects of chemical com bination on X-ray spectra. The subjects presented represent a broad scope of applications of X-rays to a variety of fields and disciplines. These included such fields as electron-probe microanalysis, the effect of chemical combination on X-ray spectra, and the uses of soft and ultrasoft X-rays in emission analysis. Also included were sessions on X-ray diffraction and fluor escence analysis. There were several papers on special topics, including X-ray topography and X-ray absorption fine-structure analysis. William L. Baun contributed considerable effort toward the conference by organizing the session on the effect of chemical combination on X-ray spectra fine structure. A special session was established through the excellent efforts of S. P. Ong on the uses and applica tions of soft X-rays in fluorescent analysis. We offer our sincere thanks to these men, for these two special sessions contributed greatly to the success of the conference.
Advances In X Ray Analysis
DOWNLOAD
Author :
language : en
Publisher:
Release Date : 1986
Advances In X Ray Analysis written by and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1986 with X-rays categories.
Advances In X Ray Analysis
DOWNLOAD
Author : William M. Mueller
language : en
Publisher: Springer
Release Date : 1995-12-31
Advances In X Ray Analysis written by William M. Mueller and has been published by Springer this book supported file pdf, txt, epub, kindle and other format this book has been release on 1995-12-31 with Science categories.
A real need exists for ways to bridge the gap between basic research and prac tical application, for faster utilization of new discoveries and new developments in the world of technology, and for technical transfer of defense and space accomplish ments to the civilian economy. The problem is compounded by the torrential flow of technical information. Thirty million books are available on technical subjects, the total increasing at the rate of six hundred every day. There are one hundred thousand technical journals. More scientific work has been published in the past ten years than in all preceding recorded history. Scientists and engineers only a few years beyond academic pursuits are already encountering a continuing need for retraining and expansion of their own knowledge. At the same time, the re searchers - scientists, engineers, students - must exhibit bold creative thinking to evolve new technology, to better understand nature's secrets, to conceive new theories, and to reduce old theories to practical utilization. Research in the physical sciences and the engineering sciences provides the ever-flowing spring of knowledge for the investigation of new ideas. Such research is sometimes hindered by classification as "basic" or "applied. " There are many times when a research program has no immediate or ultimate objective and is truly contributing to our reservoir of knowledge - a reservoir which will certainly be tapped in the future.
Advances In X Ray Analysis
DOWNLOAD
Author : Charles S Barrett
language : en
Publisher: Springer
Release Date : 1992
Advances In X Ray Analysis written by Charles S Barrett and has been published by Springer this book supported file pdf, txt, epub, kindle and other format this book has been release on 1992 with Science categories.
The proceedings of the combined First Pacific-International Congress on X-Ray Analytical Methods (PICXAM) and Fortieth Annual Conference on Applications of X-Ray Analysis, held in Hilo and Honolulu Hawaii, August 1991, comprise reports on the latest developments in international research on X-ray fl
Advances In X Ray Analysis
DOWNLOAD
Author : Charles Barrett
language : en
Publisher: Springer Science & Business Media
Release Date : 2013-06-29
Advances In X Ray Analysis written by Charles Barrett and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2013-06-29 with Science categories.
The application of solid-state detectors of high energy resolution to x-ray spectrometry, and the increasing use of compu ters in both measurement and data evaluation, are giving a new stimulus to x-ray techniques in analytical chemistry. The Twentieth Annual Denver X-ray Conference reflects this renewed interest in several ways. The invited papers, grouped in Session I, review the charac teristics of the detectors used in the measurement of x-rays. One paper is dedicated to the detection of single ions. Although such a subject may appear to be marginal to the purposes of the Denver Conference, we must recognize the affinity of techniques applied to similar purposes. Ion probe mass spectrometry is dedicated to tasks similar to those performed by x-ray spectrometry with the electron probe microanalyzer. Scientists and technologists will see these two techniques discussed in the same meetings. The discussion of automation and programming is not limited to the two invited speakers, but extends to papers presented in more than one session. The matter of fluorescence analysis by isotope- and tube-excitation will also be of great interest to those concerned with the practical applications of x-ray techniques. The communications contained in this volume, and the lively discussions which frequently followed the presentation of papers, attest to the vitality of the subjects which are the concern of the Annual Denver X-ray Conference.
Advances In X Ray Analysis
DOWNLOAD
Author : C. Grant
language : en
Publisher: Springer
Release Date : 1974-04
Advances In X Ray Analysis written by C. Grant and has been published by Springer this book supported file pdf, txt, epub, kindle and other format this book has been release on 1974-04 with Science categories.
The successful application of x-r~ diffraction techniques and x-r~ spectrometry depends in large measure on the availability of dependable standards and reference data. The preparation of such standards in the fields of metallurgy, geology, life sciences, and other disciplines is both costly and time consuming. As a result. the necessary standards for effective utilization of existing instrumentation are often not available. One of the purposes of the invited papers in this 22nd Annual Denver X-Ray Conference was tc review the status of programs to prepare such standards and reference data. Simultaneously, it seemed appropriate to examine the role of sampling both in terms of standards and samples to be analyzed. The first section of the invited papers focuses on the standards and reference data problems. In addition, many of the contributed papers offer information on this theme. The second topic in the invited papers consi ders the problem of sampling. If we recognize that analyses are conducted on samples which vary in size from several grams to a few micrograms or less, the magnitude of the random and systematic error components of sam pling on the quality of results should be obvious. Many of the contributed papers in such fields as air pollution and similar disciplines speak clear ly to the difficulty of obtaining "representative" samples. The papers contained in this volume and the many lively discussions such as the panel discussion at the close of the first session of papers should stimulate further attention to this vital topic.
Advances In X Ray Analysis
DOWNLOAD
Author :
language : en
Publisher:
Release Date : 1991
Advances In X Ray Analysis written by and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1991 with X-rays categories.
Advances In X Ray Analysis
DOWNLOAD
Author : Conference on Application of X-ray Analysis
language : en
Publisher:
Release Date : 1957
Advances In X Ray Analysis written by Conference on Application of X-ray Analysis and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1957 with X-rays categories.
Advances In X Ray Analysis
DOWNLOAD
Author : Charles S. Barrett
language : en
Publisher: Springer
Release Date : 2013-03-26
Advances In X Ray Analysis written by Charles S. Barrett and has been published by Springer this book supported file pdf, txt, epub, kindle and other format this book has been release on 2013-03-26 with Science categories.
The 35th Annual Denver Conference on Applications of X-Ray Analysis was held August 4-8, 1986, on the campus of the University of Denver. Since the previous year's conference had emphasized x-ray diffraction, this year the Plenary Session spotlighted x-ray fluorescence, with the title "Trends in XRF: A World Perspective," featuring renowned speakers from three major areas. XRF IN NORTH AMERICA, by Prof. D. E. Leydon, from Colorado State University, dealt specifically with developments in the fields of instrumentation, data treatment and applications in that part of the world. Prof. H. Ebel, from the Technical University of Vienna, discussed XRF IN EUROPE, concentrating on subjects including total reflection, improved fundamental parameters, quantitation without standards and imaging techniques. Tomoya Arai, of the Rigaku Industrial Corporation in Japan, in considering XRF IN THE FAR EAST, described the scientific activity in XRF and the applications thereof, primarily in Japan and China. These plenary lectures were interspersed with short discussions of PERSONAL OBSERVATIONS on the subject by the co-chairmen of the SeSSion, Ron Jenkins and myself. The intent of this session was to bring the audience up-to-date on the status of the field in various parts of the world, and to give some feeling concerning where it is likely to go in the immediate future. Hopefully, the publication of the written versions of those presentations in this volume will make the authors' thoughts available to many who could not be present at the conference.
Advances In X Ray Analysis Vol 2
DOWNLOAD
Author : W. M. Mueller
language : en
Publisher:
Release Date : 1960
Advances In X Ray Analysis Vol 2 written by W. M. Mueller and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1960 with categories.