Microelectronic Reliability

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Reliability Prediction For Microelectronics

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Author : Joseph B. Bernstein
language : en
Publisher: John Wiley & Sons
Release Date : 2024-02-13

Reliability Prediction For Microelectronics written by Joseph B. Bernstein and has been published by John Wiley & Sons this book supported file pdf, txt, epub, kindle and other format this book has been release on 2024-02-13 with Technology & Engineering categories.

RELIABILITY PREDICTION FOR MICROELECTRONICS Wiley Series in Quality & Reliability Engineering REVOLUTIONIZE YOUR APPROACH TO RELIABILITY ASSESSMENT WITH THIS GROUNDBREAKING BOOK Reliability evaluation is a critical aspect of engineering, without which safe performance within desired parameters over the lifespan of machines cannot be guaranteed. With microelectronics in particular, the challenges to evaluating reliability are considerable, and statistical methods for creating microelectronic reliability standards are complex. With nano-scale microelectronic devices increasingly prominent in modern life, it has never been more important to understand the tools available to evaluate reliability. Reliability Prediction for Microelectronics meets this need with a cluster of tools built around principles of reliability physics and the concept of remaining useful life (RUL). It takes as its core subject the ‘physics of failure’, combining a thorough understanding of conventional approaches to reliability evaluation with a keen knowledge of their blind spots. It equips engineers and researchers with the capacity to overcome decades of errant reliability physics and place their work on a sound engineering footing. Reliability Prediction for Microelectronics readers will also find: Focus on the tools required to perform reliability assessments in real operating conditions Detailed discussion of topics including failure foundation, reliability testing, acceleration factor calculation, and more New multi-physics of failure on DSM technologies, including TDDB, EM, HCI, and BTI Reliability Prediction for Microelectronics is ideal for reliability and quality engineers, design engineers, and advanced engineering students looking to understand this crucial area of product design and testing.

Microelectronic Reliability Reliability Test And Diagnostics

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Author : Edward B. Hakim
language : en
Publisher: Artech House Publishers
Release Date : 1989

Microelectronic Reliability Reliability Test And Diagnostics written by Edward B. Hakim and has been published by Artech House Publishers this book supported file pdf, txt, epub, kindle and other format this book has been release on 1989 with Technology & Engineering categories.

Text/reference spaning the theoretical concepts of reliability models and failure distributions, to GaAs microcircuit processing and test. Provides background on the development of quality assurance and verification procedures. Some of the new changes under development to cope with pressures brought

Microelectronic Reliability Integrity Assessment And Assurance

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Author :
language : en
Publisher:
Release Date : 1989

Microelectronic Reliability Integrity Assessment And Assurance written by and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1989 with Semiconductors categories.

Microcircuit Reliability Bibliography

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Author :
language : en
Publisher:
Release Date : 1974

Microcircuit Reliability Bibliography written by and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1974 with Integrated circuits categories.

Microelectronics Failure Analysis

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Author :
language : en
Publisher: ASM International
Release Date : 2004-01-01

Microelectronics Failure Analysis written by and has been published by ASM International this book supported file pdf, txt, epub, kindle and other format this book has been release on 2004-01-01 with Technology & Engineering categories.

For newcomers cast into the waters to sink or swim as well as seasoned professionals who want authoritative guidance desk-side, this hefty volume updates the previous (1999) edition. It contains the work of expert contributors who rallied to the job in response to a committee's call for help (the committee was assigned to the update by the Electron

Smart Power Ics

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Author : Bruno Murari
language : en
Publisher: Springer Science & Business Media
Release Date : 2002-06-13

Smart Power Ics written by Bruno Murari and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2002-06-13 with Design categories.

This book provides a survey of the state of the art of technology and future trends in the new family of Smart Power ICs and describes design and applications in a variety of fields ranging from automotive to telecommunications, reliability evaluation and qualification procedures. The book is a valuable source of information and reference for both power IC design specialists and to all those concerned with applications, the development of digital circuits and with system architecture.

Microelectronic Reliability Integrity Assessment And Assurance

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Author : Emiliano Pollino
language : en
Publisher: Materials Science Library
Release Date : 1989

Microelectronic Reliability Integrity Assessment And Assurance written by Emiliano Pollino and has been published by Materials Science Library this book supported file pdf, txt, epub, kindle and other format this book has been release on 1989 with Technology & Engineering categories.

A companion to v.1 (which covers reliability, test, and diagnostics), this volume explains the main failure mechanisms which may affect silicon devices and shows their effect on reliability characteristics. Due to the importance of VLSI devices, emphasis is given to metalizations and latch-up. Acidi

Microelectronic Device Data Handbook

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Author : ARINC Research Corporation
language : en
Publisher:
Release Date : 1968

Microelectronic Device Data Handbook written by ARINC Research Corporation and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1968 with Microelectronics categories.

Research And Technology Program Digest

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Author : United States. National Aeronautics and Space Administration
language : en
Publisher:
Release Date :

Research And Technology Program Digest written by United States. National Aeronautics and Space Administration and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on with categories.

Reliability And Quality In Microelectronic Manufacturing

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Author : A. Christou
language : en
Publisher: RIAC
Release Date : 2006

Reliability And Quality In Microelectronic Manufacturing written by A. Christou and has been published by RIAC this book supported file pdf, txt, epub, kindle and other format this book has been release on 2006 with Business & Economics categories.